Used GAERTNER L116 B #9022059 for sale

GAERTNER L116 B is an ellipsometer based on a rotating polarizer analyzer scheme. It uses a high precision rotary stage, equipped with a linear damper, to rotate a polarized light beam incident on the sample, while a second detector measures its angle of rotation, or the degree of polarization change. The advantage of this model is that it allows measurements over a large spectral range with high accuracy, and is one of the most popular models in the industry. L116 B utilizes the rotating analyzer technique to measure the degree of polarization change of light as a result of the sample's interaction with the incident polarized beam of light. The angle of rotation of the polarized beam is recorded as a function of angle of incidence and quantified as a value on the ellipsometer known as the 'Ψ value'. This angle is calculated by measuring the difference between the incident angle of the polarized and the detected angle from the sample. In addition to the angle value, GAERTNER L116 B also measures a parameter known as the Δ value. This value is the difference between the s- and p- components of the electrical field of the two polarization states that make up the incident beam, and is used in conjunction with the Ψ value to determine more accurately the properties of the sample surface. Measurement with L116 B has the capacity to measure extremely thin films down to 10 nanometers thick, and is suitable for many applications such as aluminum sheet processing, coatings, optical filters, semiconductors, organic thin films and polymers. The instrument features a range of optics, sources, and detectors, designed to assure the highest accuracy in any sample material. GAERTNER L116 B is a fast and compact unit, with a convenient user interface, allowing quick and easy operations. It provides accurate data over a wide range of angles, which is important for applications like coating thickness measurements and surface characterizations. L116 B has been used in the manufacturing of semiconductors, optical elements, and other applications related to thin film measurement. The use of its rotating polarizer and analyzer scheme enables GAERTNER L116 B users to measure a wide range of optical parameters with high precision and accuracy. Overall, L116 B is an excellent choice for accurate and reliable measurements in a wide range of applications. Its compact size and convenient user interface provide an easy to use instrument that offers accurate results quickly and reliably.