Used GAERTNER L116 B #9383008 for sale

GAERTNER L116 B Ellipsometer is a robust and reliable optical ellipsometer designed to characterize thin films and surfaces. This inspection instrument uses polarized light to measure the thickness and optical properties of a sample layer, providing accurate analysis without causing any sample damage. L116 B uses a wavelength range of 190 - 1100 nm, allowing users to measure refractive index, extinction coefficient, layer thickness, and other optical properties of both single and multiple layer films. The measurement capabilities of GAERTNER L116 B are made possible through the use of a Michelson interferometer and four separate detectors. The incident light produced by the laser beam is passed through a beam splitter and a compensator plate before arriving at the sample. Upon entering the sample, the light is partially reflected and partially refracted before a photodetector measures it and sends the information to the data analysis system. In order to ensure the accuracy of measurements, all beam-splitting components utilization in L116 B are kept to a minimum in order to ensure maximum performance of the instrument. This allows for precise optical characterization over a large dynamic range while providing a minimized wavelength range with consistent wavelength accuracy. GAERTNER L116 B utilizes a digital imaging system that allows for automated analyses to speed up the data collection process. Image processing is also used in combination with a variety of algorithms to determine the optical properties of a sample layer. The combination of software and hardware allows the instrument to perform advanced analytical calculations and generate comprehensive reports that can be used for research, development, and quality control applications. The user-friendly interface of L116 B also provides a variety of features that optimizes the user experience. Advanced data management options provide easy access to stored files, allowing users to easily review trends in their data. The instrument also includes a range of reference settings, making the calibration of the device easy. GAERTNER L116 B provides a reliable, accurate, and affordable solution for optical ellipsometric characterizations for thin films and materials. With its user-friendly interface and advanced features and capabilities, this instrument provides a powerful and reliable platform for a variety of research, development, and productione applications.