Used GAERTNER L116 C #191770 for sale

GAERTNER L116 C Ellipsometer is the latest in ellipsometric analysis technology and allows for quick, non-destructive, and accurate measurements of film thicknesses, layer refractive indices, and optical constants of optical films, on any substrate. This highly advanced ellipsometer offers the highest accuracy and repeatability available, making it suitable for all materials that can be studied optically. L116 C Ellipsometer is designed for a range of applications, such as in electronic materials manufacturing, optical device manufacturing and biological sample characterization, and features an intuitive, user-friendly interface to maximize efficiency and operation time. This equipment has a wide range of measurement modes, allowing you to accurately measure thick films and stacks. The system is powered by two high power He-Ne lasers, which enable a large dynamic range, allowing it to measure films between 0.01-100 μm thick with repeatable accuracy. GAERTNER L116 C Ellipsometer also features advanced optical components for high precision measurements, including a servo-controlled collar and a linear polarizer, ensuring the highest levels of accuracy. Additionally, the large sample holder and stage allows this unit to accommodate various substrate sizes, shapes and forms. Furthermore, the machine has an automatic calibration feature, making setup quick and easy. L116 C Ellipsometer also comes with advanced data analysis software, which provides a comprehensive report of the data obtained. This helps to identify different film types, layer parameters and process yields. Furthermore, the software helps to analyse the composition and properties of surface films, enabling the user to make adjustments on the sample coating and spin coating processes. The software also provides graphical displays of the ellipsometric data, helping the user to better understand their results. Overall, GAERTNER L116 C Ellipsometer is an indispensable tool for those in the development and manufacture of optical films, in research and development and in metal-organic chemical vapor deposition (MOCVD) industries. The combination of highly accurate and repeatable measurements and easy-to-use data analysis software makes this tool a powerful and reliable tool for anyone looking to study materials optically.