Used GAERTNER L116D #9048961 for sale

GAERTNER L116D is a robust, highly accurate, and reliable ellipsometer designed for industrial applications. This ellipsometric equipment uses advanced laser technology-based instrumentation to measure the optical characteristics of a material. It is used to characterize the film thickness and optical properties of various materials, such as metal, semiconductor and soft materials. The system comprises two main optical components, which are a light source and a detector. The light source monitors the angle of incidence of the light while the detector measures the reflected light amounts. By accurately measuring both angles, the unit can calculate the optical properties of the material being tested, such as its refractive index, absorption coefficient and film thickness. L116D is equipped with four polarizers and an observer-controlled Monochromator. It is also capable of real-time measurements at 1 kHz. It is rated for temperatures between 10 and 40 degrees Celsius and features a wide range of measurement speeds ranging from 0.07 nanometer to 20 nanometer. The optical measurement of GAERTNER L116D ellipsometer provides high precision data that can be used for thickness or refractive index characterization of thin films or other transparent or semi-transparent layers on a substrate. This machine is also used to measure film thicknesses in hard-to-reach areas and in multiple substrate configurations. L116D tool is used by many industries, including in the research and development of electronic components, automotive components, aerospace systems, and consumer products. It is suitable for many research and industrial applications due to its accuracy and reliability. This ellipsometer is a fast, reliable, and easy to use tool for optical characterizing of thin films.