Used GAERTNER L116D #9176490 for sale

GAERTNER L116D is a state-of-the-art ellipsometer used for measuring the optical properties of thin films, substrates, and other surfaces. An ellipsometer measures changes in the polarization state of light after it reflects off a sample surface. L116D is able to measure the thickness, refractive index, extinction coefficient, and other layer properties of thin films. GAERTNER L116D has a motorized stage with 1 µm steps to precisely position the sample for characterization. It uses a single-frequency, laser diode source at 633 nm for illumination. It also has a rotatable birefringent compensator to properly polarize the light. A detector detects changes in the reflected light and is used to measure the degree of polarization as a function of angle. L116D also utilizes computer-controlled polarizers to measure the intensity of the light after it reflects off the sample and a camera to measure polarization states directly from the image plane. GAERTNER L116D utilizes non-contact, non-destructive imaging techniques to measure thin films and substrate properties. This includes ellipsometry measurements, polarimetric imaging (PI), and reflectometry imaging (RI). Its single-beam ellipsometer is optimized for layer measurements from 200 nm to 12 µm. Its PI and RI systems can measure to depths of 600 nm. All measurements are collected through L116D's embedded computer, which allows for easy analysis and integration with other platforms. GAERTNER L116D can be used to measure a variety of optically thin films and substrates, including multilayer films, metal films, dielectric films, and semiconductors. It is a reliable equipment with excellent sensitivity and repeatability, and can be used for both research and production applications. The system is also capable of measuring complex structures that require multiple beams with different angles of incidence to ascertain properties like birefringence and retardance. Overall, L116D is a complete, automated ellipsometer unit that is capable of measuring optical properties of thin films and other surfaces quickly and accurately. It is a reliable and sensitive machine suitable for many diverse applications.