Used GAERTNER L117 C #9011501 for sale

GAERTNER L117 C is an ellipsometer that allows for the non-destructive and precise measurement of surface characteristics including film thickness, refractive index, and optical anisotropy of samples. The ellipsometer is equipped with a variable angle of incidence (AOI) from 0° to 85°, allowing for measurements at a variety of angles. L117 C utilizes a variant of the Brewster's Angle, most commonly known as the Monochromatic Variable Angle Ellipsometry (MVAE) technique, which accurately measures the polarization state of light reflected from samples allowing for depth profiling up to 5 microns. GAERTNER L117 C utilizes a helium neon (HeNe) laser with a wavelength of 632.8 nanometres that is focused and incident on the sample at the preset AOI. The polarized light is then reflected with various components, including amplitude and phase, determining the related polarization state of the reflected light. This polarization state is measured and analyzed using L117 C's precision optics and PC-based software, resolving sample properties to resolutions in the nanometre range. Variations in sample materials can be detected through GAERTNER L117 C's ability to detect changes in refractive index and optical anisotropy, useful for the evaluation of liquid and solid interface characteristics. L117 C can also effectively measure the thickness of very thin films and quantify differences in surface orientation of layered materials with a sensitivity of 0.2nm. GAERTNER L117 C is integrated with a sample holder platform, enabling samples to be easily mounted and moved across the x and y-axis lab tables. The holder can support samples up to 200x100mm with a maximum sample thickness of 12mm. The sample holder is also equipped with quick-release mechanisms that allow for fast sample loading and unloading. L117 C is a non-destructive, highly sensitive ellipsometer that provides accurate analysis of various sample characteristics. Its superior circumferential optics with a wide range of AOI measurements, combined with its intuitive PC-based software, makes it an ideal tool for the evaluation of organic and inorganic thin films, liquid/solid interfaces, and other nanostructures.