Used GAERTNER L2W26D.488 #9224475 for sale

GAERTNER L2W26D.488 is a white light scanning Ellipsometer equipment designed for thin film measurement and characterization. This system provides between one and three wavelength channels along with the ability to adjust beam polarization in order to accurately obtain the necessary measurements. The L2W26D.488 can measure between 0° & 360° with an azimuthal scanning range of +/-35° which offers great flexibility in research and production applications. This Ellipsometer operates using the Wollaston Prism unit, an optical element that divides a beam of light into two linearly polarized components at right angles to each other. The L2W26D employs a track-mounted prism machine, coupled with a rotatable polarizer that can be adjusted to either an s-polarization or p-polarization. The polarized beams are directed to the sample where they undergo a phase shift 90° apart. The tool then determines the ratio of the phase shift angles to select the minimum and maximum value, and finally the ratio measurement is calculated. GAERTNER L2W26D.488 offers high resolution measurements with a repeatability of 6 arcseconds. This accuracy is further enhanced using an atom optics monochromator, providing continuous spectral control and eliminating the need to manually switch filters. The asset also comes with Helium Neon (HE-NE) and diode laser options, providing users with a choice between a number of different light source wavelengths. The Ellipsometer has an integrated SOPHIST S2 software that allows the user to analyse the data, create reports and store results. Additionally, it offers an automated film imaging and thickness calculations feature. This enables users to quickly visualize wafer maps and provide thickness data for up to 32 wafer sites simultaneously. The L2W26D.488 is well suited for applications ranging from production environments to research laboratories. Its wide range of features including the adjustable polarization, variable scanning angles, wide choice of light sources and integrated software make GAERTNER L2W26D.488 an excellent choice for all kinds of thin film measurement and characterization tasks.