Used HORIBA / JOBIN YVON 23300014W #293644233 for sale

HORIBA / JOBIN YVON 23300014W Ellipsometer is a powerful and precise precision instrument used for measuring the optical properties of thin film samples. HORIBA 23300014W Ellipsometer utilizes an Ellipsometry technique to measure the polarisation state and changes of light reflected from a sample's surface, allowing for the analysis of the optical constants such as refractive indices and reflectivity of the sample. The Ellipsometer consists of two primary elements. The first is the incident meter, which generates light that is then polarized with a polarizing beam-splitter and then incident onto the sample. The second element is the detector meter, which measures the change in the polarization of the reflected light. The detector is further divided into an analyzer, which detects the direction of the oscillation plane and a CCD camera, which measures the change in the intensity of the reflected light coming from the sample. In accordance with the laws of wave optics, the two linearly polarized beams, the incident and the reflected, are arranged in a plane that is perpendicular to the sample surface. The angle between the reflected beam and the incident beam is referred to as the Ellipsometric angle. The polarized ellipsometry technique is then used to measure the relative behaviour of the two beams, both the direction and the magnitude at different incident angles for different light polarizations. The instrument features a wavelength of 635nm and a full field of view of 3mm, with an accuracy of 0.8 arcsec. The system also includes a software interface which allows for the real-time capture and analysis of data while controlling the settings of the instrument in real time. JOBIN YVON 23300014W Ellipsometer is an ideal instrument for applications such as thin film sample analysis, semiconductor wafer characterization, colorant deposits, surface adhesion, chemistry, materials science, and optical engineering. This instrument is designed to provide a high level of accuracy, repeatability, and reliability in laboratory and industrial environment settings.