Used HORIBA / JOBIN YVON Gonio UT300 #9275719 for sale
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ID: 9275719
Ellipsometer
Control unit
UVISEL Modulator
Analyzer head
Source supply box
FUV200 Monochromator
MWL Scan unit
FUV200 Monochromator
XYZ Stage 300
Includes:
Computer
Monitor
Keyboard
Mouse
(2) USB Keys
OSRAM XBO 150W/4 Xenon Short arc lamp bulbs
Manuals and CD.
HORIBA / JOBIN YVON Gonio UT300 is an advanced ellipsometer instrument used for measuring the optical properties of materials. It is highly accurate and precise in its measurements, and can be used to measure parameters such as film thickness, optical constants, and composition. HORIBA Gonio UT300 features a rotatable goniometer head which rotates around the sample, so that the angle of incidence of the light used to detect change in the sample is adjustable. The samples are placed on a precision-controlled XYZ translation stage, which allows for operation at any arbitrary angle of incidence. The unit also has a built-in optical quartz compensator, which is used to account for the difference in optical properties between the sample and the substrate being measured. JOBIN YVON Gonio UT300 is able to measure a wide range of materials, ranging from dielectrics and semiconductors to insulators and organic polymers. Additionally, the instrument is able to work with both air and liquid cells, allowing for fewer restrictions on the types of samples that can be used. Gonio UT300 comes equipped with a powerful computer system and a comprehensive software package. This allows for comprehensive data acquisition, analysis, and visualization applications. Additionally, the software is able to integrate with other instruments, allowing for efficient and automated data processing. The instrument is additionally equipped with a built-in data logging and report generation function, allowing for easy documentation of the results. The instrument console features a large LCD screen, making it easy to operate with little user intervention. HORIBA / JOBIN YVON Gonio UT300 is an easy to use and reliable tool in the determination of optical properties of thin-film substrates and materials.
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