Used HORIBA / JOBIN YVON UVISEL II #293656859 for sale

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ID: 293656859
Spectroscopic ellipsometer.
HORIBA / JOBIN YVON UVISEL II is a state-of-the-art ellipsometer for advanced applications in research, development, production and quality assurance. HORIBA UVISEL II ellipsometer automatically measures the optical properties of materials with a high accuracy, at the nanometer-range to the millimeter-range. It can be used for thickness and optical constants measurements. The ellipsometer has a high-power stereo microscope for direct inspection of samples with resolutions of up to 100x, along with precise automated angle orientation. This microscope along with the polarized incident light makes it effective to measure down to nanometer-scale thin film layers, rough surface variations, and weak reflectivities. JOBIN YVON UVISEL II is adaptable and configurable with a range of accessories, detectors, and probes that enable it to measure a wide range of samples and parameters. This includes specular, semi-specular, and non-specular surfaces, thin, thick, and multilayer films, and samples that range from liquid, powder, or mesh to solids or plastics. UVISEL II uses a phase modulation ellipsometer to measure the optical constants of the sample. It delivers results through a multiparameter display system, with a real-time graphical interface that shows the ellipsometric angle and the reflectance of the polarizer, sample, and analyzer. Furthermore, it is equipped with a precision stepper motor that allows for the precise positioning of the sample relative to the incident light for accurate measurements. HORIBA / JOBIN YVON UVISEL II uses an international database that is based on the Cauchy dispersion formula for computer-aided analysis. A variety of computation tools are available on the device including parameter fitting, film modeling, and thickness measurement. Additional user-defined functions can be incorporated into the device. HORIBA UVISEL II is backed by excellent customer service and its support documents. It is the go-to ellipsometer for advanced applications in research, development, and quality assurance.
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