Used HORIBA / JOBIN YVON UVISEL II #9038921 for sale

HORIBA / JOBIN YVON UVISEL II is an ellipsometer, a type of instrument used to measure the thickness and optical properties of thin films formed on surfaces. Ellipsometers analyze the changes in polarized light when it reflects off a surface, allowing users to determine the optical properties of the surface. HORIBA UVISEL II uses a rotating analyzer, which allows for a wide range of measurements over a range of incident light wavelengths. This includes the study of optical constants such as refractive index, extinction coefficient, and absorption coefficient. Ellipsometers are widely used in industry to study the optical properties of thin films formed on surfaces, including semiconductor substrates such as silicon, gallium arsenide, and indium phosphide. Ellipsometers are also used in research, for the characterization of materials, and for quality control in the manufacturing process. JOBIN YVON UVISEL II has a closed optical path system utilizing a vertically mounted twin laser beam source. This offers the user the ability to perform measurements over a range of incident light wavelengths from 250 to 840 nanometers (nm). The wavelength range can also be adopted to advise the user of the best measurements to use at any particular laser angle. Additionally, the instrument includes a polarization analyzer which provides measurements at both s- and p-polarized angles using an incident laser beam at the sample surface. The instrument offers a range of computer control options, with easy point and shoot measurements, automated sample changers, and more advanced programs allowing the user to configure the instrument for more detailed studies. Data is collected via a linked computer, with the instrument incorporating digital feedback controls to ensure exact reproducibility. UVISEL II has a built-in sample chamber which is temperature and humidity controlled, allowing measurements to be taken from room temperature up to 200 degrees Celsius. The instrument is also designed to be compatible with background subtraction and background correction measurements, which allows it to automatically correct for possible environmental influence on the measurements. Overall, HORIBA / JOBIN YVON UVISEL II is a highly accurate and reliable ellipsometer, which offers a range of measurement options to allow users to gain an insight into the optical properties of thin films formed on surfaces. The instrument is user-friendly, easy to use, and can provide a high level of accuracy in its data collection.