Used HORIBA / JOBIN YVON UVISEL II #9357627 for sale

HORIBA / JOBIN YVON UVISEL II is a powerful UV/Visible spectroscopic equipment designed for ellipsometry measurements in a wide range of application areas. This versatile, high performance instrument measures film thickness and refractive index of transparent and opaque materials with excellent accuracy and repeatability to provide an incredible level of material characterization. Featuring an advanced single, double, and multiple polarization analysis, HORIBA UVISEL II also offers scanning angle with variable step mode and angular range selection. This ensures high quality characterization of all types of thin film structures from single layer to multilayer systems. It is capable of measuring the optical properties such as refractive index and extinction coefficient of coatings, while the multiple polarization option can control the angles for measurements at a variety of angles, providing unmatched characterization of thin film systems and materials. The extraordinary precision of JOBIN YVON UVISEL II is incomparable to other ellipsometry systems. Its automated acquisition and control system offer faster and smoother data collection, while its intuitive user-friendly interface encourages maximum efficiency. This unit also includes a high-resolution rotator and an optical detector with signal-to-noise ratio greater than 1500:1, compared to other ellipsometers in the industry. With advanced PC-based hardware, powerful software controls, and convenient machine upgradability, UVISEL II legacy provides adaptability for a wide range of application requirements. Furthermore, its strong technical advantage makes it the ideal choice for process control and high precision in industrial and scientific applications. In conclusion, HORIBA / JOBIN YVON UVISEL II is the perfect ellipsometer for researchers and engineers looking for a dependable tool to characterize film structures, measure thin films, and control their optical properties. Its high resolution capabilities and intuitive user interface make it the ideal choice for precision characterization of a wide range of transparent and opaque materials.