Used HORIBA / JOBIN YVON UVISEL #16890 for sale

ID: 16890
Wafer Size: 8"
Vintage: 1997
Spectroscopic phase modulated Ellipsometer, 8" With 200-800nm range, Xenon light source with fiber optic delivery, polarizer, and photoelastic modulator, MECS UTC-200R transfer robot handles up to 200mm wafers, includes software and Manuals 1997 vintage.
HORIBA / JOBIN YVON Uvisel is a powerful and versatile ellipsometer that is used for in-depth measurements of thin films as well as solutions. HORIBA Uvisel provides both polarization-modulating and spectroscopic-variation techniques in its set-up and is ideal for research of an optically-thick sample. It is the first and leading optical characterization instrument that combines the best of both techniques. At the heart of JOBIN YVON Uvisel is a light source, which is capable of emitting light at multiple wavelengths. Depending on the application, it can operate in either the DC-Excitation (DCX) or Frequency-Modulation (FM) mode. The DCX mode offers continuous 'DC-excitation' measurements, while the FM mode uses non-uniform amplitude and phase modulation of the light source for finer resolution. Uvisel is fitted with two rotating polarizers, each with a motorized angle setting system. These polarizers allow for accurate measurement of many sample characteristics, from reflection and absorption, to optical constants and surface roughness. The team of polarizers also enable researchers to determine thickness and optical properties of materials with a higher degree of accuracy and precision. HORIBA / JOBIN YVON Uvisel has a wide range of detection optics, allowing for measurements from 0.5 to 12.5 wavelengths. Detection optics are composed of signals, which are metal lenses followed by a detector system. This detector system is capable of measuring not only the intensity, polarization, and angle of the light passing through the sample, but also the spectrum of the light. HORIBA Uvisel includes a range of software features, including data analysis and calculation of elastic constants and real part of the refractive index. This analysis helps scientists and engineers to draw more accurate conclusions about the properties of their samples. Overall, JOBIN YVON Uvisel is a powerful and versatile ellipsometer that is equipped with the latest technologies to enable detailed and accurate measurements of thin films and solutions. With its polarized metrology, spectroscopic-variation techniques, and advanced software applications, Uvisel is the perfect choice for researchers and engineers who require the highest quality of analytical data for their projects.
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