Used HORIBA / JOBIN YVON UVISEL #9038920 for sale

HORIBA / JOBIN YVON UVISEL is an ellipsometer specifically designed for the analysis of thin film coatings. The instrument is able to accurately measure the thickness of a layer, the optical constants of a film and layer, and the refractive index, absorptance and reflectance changes in the film layer. HORIBA UVISEL Ellipsometer utilizes advanced polarization technology, light source wavelength coverage, and automated data acquisition. It uses an incident beam of monochromatic light from either a laser or light-emitting diode (LED). The light is polarized as it passes through the thin film sample and then directed to a polarimeter which measures the output polarization. The polarization data obtained is then used to calculate the optical properties of the sample, including the film thickness, the refractive index of the sample, the angle of incidence, and the absorption coefficients. JOBIN YVON UVISEL Ellipsometer is designed for ease of use, with an intuitive interface for setting up the experiment, selecting a wavelength, and acquiring data. The instrument also supports multiple wavelengths ranging from 200nm to 2000nm, with LED and laser light sources available. The instrument is designed for both reflection and transmission measurements, enabling analysis of thin film coatings on standard glass and plastic substrates. Moreover, UVISEL is extremely accurate, with repeatable results for a variety of samples. During the measurement process, the instrument monitors the sample and compensates for any errors that could impact the results. This is enabled through automatic index calibration, as well as external sample temperature monitoring and sample drift compensation. Finally, HORIBA / JOBIN YVON UVISEL is an exceptionally reliable Ellipsometer that provides excellent performance and repeatability time and time again. It is the trusted instrument for thin film analysis among the semiconductor, solar, construction and research industries.