Used HORIBA / JOBIN YVON UVISEL #9213654 for sale

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ID: 9213654
Spectroscopic ellipsometer Includes: HORIBA Control unit & light source HORIBA iHR 320 Imaging spectrometer LENOVA PC Accessories & tables.
HORIBA / JOBIN YVON UVISEL is an advanced ellipsometer used to precisely measure thin film thickness at the nanoscale level. The instrument is designed with a powerful and user-friendly software package to simplify the complex measurement and operation of thin films. It has an automated measurement cycle which allows the user to quickly acquire accurate data of the optical quality of samples. This enables the user to gain rich analytical insights and utilize the system's capabilities to the fullest. HORIBA UVISEL utilizes a patented ellipsometer technique to measure the optical properties of substrates and thin films, considering the complex optical interactions between the sample's surface and light source. The optical measurements are used to determine the optical properties of the sample. The ellipsometer is equipped with a variety of interchangeable software modules and optical parameters that can be set to configure the test conditions of the sample. JOBIN YVON UVISEL is ideal for applications in quality control, lithographic process control, optical coating characterization, electronic material properties determination, thin film structural determination and others. It offers a wide range of detectable optical properties such as OPV, Reflection, and Thickness. The advanced on-board software allows the user to perform a variety of data analysis functions and measurements from a single platform. The instrument can be integrated with PC and other automation systems for multi-level data analysis. In addition, the system is equipped with an ergonomically designed optical table for easy positioning of the sample while taking measurements. In addition, a fiber delivery system ensures precise positioning of the analysis equipment. In summary, UVISEL is a high-precision ellipsometer designed for quality assurance and thin film measurement applications. With its advanced design, the instrument provides users with the ability to measure thin films quickly and accurately. The on-board software enables automated data acquisition and analysis while the versatile accessories allow for convenient positioning of the sample.
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