Used J.A. WOOLLAM AccuMap SE UI-1500 #9301004 for sale

J.A. WOOLLAM AccuMap SE UI-1500 Ellipsometer is a high precision spectroscopic ellipsometer designed to measure the optical properties of thin films and surfaces. This fully automated instrument combines high resolution ellipsometry with a programmable sample positioner for samples up to 200 mm in size. It produces accurate and reliable measurements of film thicknesses, optical constants (index of refraction and absorption coefficient), and surface roughness of a wide range of materials. The UI-1500 features a highly sensitive spectroscopic detection equipment with a wide array of wavelengths available from the ultra-violet (UV) to near-infrared (NIR) range. The system can measure angles of incidence (AOI) ranging from 0° to 85° for accurate and reliable results. The instrument also features an automated wafer alignment unit and a sample positioning machine for easy sample loading. The precision optics of the UI-1500 deliver excellent signal to noise ratio for exceptional accuracy. The instrument also features a high accuracy data acquisition and processing tool for accurate and timely data analysis. The asset can be configured for use in both rotating and non-rotating configurations, and can be used for a variety of applications such as: Film deposition (thickness, optical constants, etc.) Surface characterization (roughness, optical constants) Adhesion testing Optical parameters of nanostructures Thin film stress analysis. The UI-1500 comes with a variety of software and hardware options to ensure that it meets the needs of diverse applications. It supports automated wafer loading and wafer mapping for fast and efficient sample analysis, as well as real-time data acquisition and data analysis for quick results. The UI-1500 also features an easy-to-use graphical user interface for configuring resolution and exposure times. The UI-1500 is the perfect instrument for characterizing thin films and surfaces. With its precision optics, automated setup capabilities, and user-friendly design, this spectroscopic ellipsometer is an ideal choice for research and development labs looking for an accurate and reliable way to measure film thicknesses, optical constants, and surface roughness of varying materials.