Used J.A. WOOLLAM H-VASE #9182681 for sale

J.A. WOOLLAM H-VASE (Horizontal Variable Angle Spectroscopic Ellipsometer) is an ellipsometer designed for the quantitative characterization of thin-films and surface-remote sensing. It is capable of measuring the optical properties of sample surfaces without using contact probes or other physical measurements. H-VASE offers a unique combination of high-speed, accuracy and reliability for commercial, industrial and scientific applications. The instrument's automated measurement functions provide for repeatable film measurements, with a large dynamic range for precise thickness determination. It has a configurable measurement approach to optimize measurement coverage and capture the thin-film properties of interest. J.A. WOOLLAM H-VASE's vertically and horizontally-variable angle of incidence design ensures accurate thin-film characterization. The variable angle of incidence avoids the need to account for any potential effects due to the angle of incidence. The variable angle of incidence allows for the measurement of materials with different refractive index and extinction coefficients. The ellipticity and reflection measurements are made using a white light source, which provides an accurate measurement of the full spectrum of the incident light. This allows characterization of reflectance, absorption, and thin film optical constants including wavelength dispersion. The laser eliminates the need for bulky polarizers and analyzers. Advanced optical simulations can also be performed with the spectroscopic ellipsometer. The built-in optical simulation software enables users to accurately simulate and analyze the optical properties of thin-films. The software also allows iterative optimization of process parameters to obtain the best optical parameters for thin-film characterization. H-VASE is available with either a single or multiple measurement decks. The single-deck configuration allows up to three layers of film material to be measured in a single measurement. Multiple measurement decks can accommodate up to seven layers of film materials. J.A. WOOLLAM H-VASE also features a variable angle sample placement, enabling measurements on a large variety of films on a single substrate. The variable angle sample placement eliminates the need for using a control sample to account for angle of incidence effects. The variable angle placement also eliminates the need for multiple measurement steps for films of different thickness. In summary, H-VASE is a spectroscopic ellipsometer designed to provide accurate and repeatable thin-film characterization. The instrument offers variable angle of incidence measurements, advanced optical simulations, and the capability to measure up to seven layers of film materials. This makes J.A. WOOLLAM H-VASE an ideal tool for commercial, industrial and scientific film characterization applications.