Used J.A. WOOLLAM M-2000 #293585945 for sale

The J.A. Woo llam J.A. WOOLLAM M-2000 is an ellipsometer designed to measure film thickness, refractive and absorption indices of a material sample. It provides accurate and robust measurements by evaluating the changes in the polarization state of light caused by reflection from the upper surface of a thin film sample. It operates based on the principle of ellipsometry, whereby the ratio of the reflected light is measured at different angles. This ellipsometer was designed by J.A. Woo llam and is recognized for its accuracy and reliable results. M-2000 consists of a laser-illuminated, highly reflective, plane sample stage and a light detection stage that are connected via a beam splitter. A low coherence helium-neon (He-Ne) laser is used to provide a controlled monochromatic and incoherent light source. This light source is directed towards the sample and the light is reflected, producing the ellipsometric signals. The ellipsometric signals are detected with a polarization mechanism and further, interpreted using a processor and an ergonomic graphical user interface. J.A. WOOLLAM M-2000 is designed to cover a wide range of films including single layer films as well as multi-layer films. The angle of incidence of the laser beam is variable, allowing for a wide range of studies such as real time spectroscopy and profile mapping, which can be used to obtain information such as film thickness, refractive and absorption indices. Furthermore, M-2000 is equipped with a computer hardware and software package that allows for easy data analysis and data querying. Due to its sophisticated design and technological advancement, the J.A. Woo llam J.A. WOOLLAM M-2000 is considered an effective tool for both the research and industry settings in the semiconductor and optical coatings industries, allowing users to gain valuable insight into the physical properties of their material samples. It offers a high degree of accuracy and reliability and is simple to operate.