Used J.A. WOOLLAM M-2000 #293618164 for sale

J.A. WOOLLAM M-2000 Ellipsometer is a highly advanced optical spectroscopy tool used for measuring optical changes in thin films. It is a tool that enables researchers to measure thin-film thickness, layer density, refractive index, and optical constants with unmatched accuracy and precision. M-2000 Ellipsometer operates in the range of 200-2000 nm and deploys a polarized laser light source to measure the ratio of s- and p-polarized reflected light. By sensing the wavelength- and angle-dependent accumulation of the elliptically polarized light, users can accurately obtain the properties of the surface and underlying layers. The system also offers data transfer with a wide selection of software solutions, including RSoft Suite software, Excel Add-In software, and a WCATM connectivity option. J.A. WOOLLAM M-2000 features advanced laser-based technology and an intuitive 7-inch touchscreen, offering the fastest and most advanced solutions for surface property measurements. M-2000 utilizes an integrated True Ellipsometry technology, which eliminates the need for input of film parameters. This ensures faster, cost-optimized and more accurate measurements. The surface normal auto-alignment feature ensures peak accuracy by automatically setting the surface normal angle. The Woollam J.A. WOOLLAM M-2000 also features an integrated multiple-direction scan that allows for simultaneous measurements from different angles. Combined with ZYGO's superior optics and advanced laser technology, this offers the ultimate accuracy and precision in thin-film measurements. Furthermore, M-2000 provides a highly reliable and robust solution with a temperature-controlled chamber, which maintains the environment to keep the measurement results stable and repeatable. All of these features and more make J.A. WOOLLAM M-2000 Ellipsometer one of the most advanced tools on the market today.