Used J.A. WOOLLAM M-2000 #293631836 for sale

J.A. WOOLLAM M-2000 Ellipsometer is an optical instrument used for thin film characterization and process control. M-2000 is equipped with a helium-neon laser which emits light in the visible spectrum (wavelength 632.8 nm), which is polarized prior to impingement of the sample surface. The polarization of the light is then altered by optical elements in the light path, who interaction with thin films already present on the sample surface. Detection of these changes in the polarization state of the light is facilitated by two high-sensitivity, large-dynamic-range detectors placed before and after the sample. J.A. WOOLLAM M-2000's unique, patented rotating analyzer technology eliminates undesirable signal components caused by sample birefringence, thereby allowing for unprecedented accuracy and repeatability in measurements of films less than a few hundred nanometers thick. The use of a tilted incident beam also dramatically reduces design-induced errors, providing a critical advantage to users in high-throughput environments. The temporal resolution of M-2000 is also remarkable, with a maximum system response of one millisecond which allows for ultrafast monitoring of rapidly changing films over the entire sample surface. The measured signal can be deconvolved into its thin film components using the included software package (J.A.W. ThinFilmLab), which contains a database of models and an interface to the recently-released global optimization routines (such as the Levenberg-Marquardt algorithm). This allows for simultaneous fitting of multiple layers, as well as determining the thickness and optical constants of arbitrary thin films with amazing accuracy. Furthermore, for users that require additional control, the software package can be customized to fit any desired model. For portable applications, J.A. WOOLLAM M-2000 is available with an integrated XY-stage with motorized positioning, allowing for automated measurements over large sample sizes. The instrument is also incredibly easy to operate, with a simple graphical user interface that ensures quick and optimal data collection. Its compact design, low power consumption, and ability to handle even the most complex samples make it an invaluable tool for any laboratory involved in thin film research.