Used J.A. WOOLLAM M-2000 #9225248 for sale

J.A. WOOLLAM M-2000 is an advanced ellipsometer used for measuring the thickness of transparent thin films. The ellipsometer has two independent Variable Angle Spectroscopic Ellipsometers (VASE) systems, each with the ability to measure a wide range of materials including metals, oxides, semiconductors, and polymers. M-2000 has the ability to measure even on difficult samples including single layers, multiple layers, layers with stepped thickness, and layers with variable refractive indices. It can also measure samples with an index of refraction different from the background, such as high-index contrast samples. J.A. WOOLLAM M-2000 provides superior accuracy and repeatability in film thickness measurement. It features a high-performance CCD-array detector, along with a highly uniform control of incident light polarization with a rapid detector readout time. The incident angle is also programmable from 5° to 85°. M-2000 is equipped with powerful analysis software which provides extensive statistical data analysis. The software also stores and manages data from an unlimited number of measurements along with previous results for easy comparison. J.A. WOOLLAM M-2000 offers greater flexibility for measuring and analyzing multiple layers of a sample with its High Resolution Ellipsometry (HRE) facility. It is quite versatile and can handle applications in most research and industrial R&D laboratories. The sample temperature can be controlled during measurements, and both strain and stress are measured accurately. M-2000 is also equipped with Linear LCD Mode for measuring flat film samples in order to save time on longer measurements. J.A. WOOLLAM M-2000 is easy to operate and requires minimal operator training. It is well-suited for materials research, including the characterization of thin films and the study of deposition processes in semiconductors, coatings, and optics. It is also widely used in the fields of biochemistry, semiconductor materials, and thin film synthesis.