Used J.A. WOOLLAM M-2000 #9249787 for sale

J.A. WOOLLAM M-2000 is a versatile optical measurement tool used to measure the thickness and optical parameters of thin films on a wide range of materials. It works by illuminating a sample with a polarized beam of light, detecting the resulting reflection and analyzing the result with sophisticated software to determine the optical properties of the sample. By measuring the differences between the intensity of light reflected from the sample at different angles and wavelengths, M-2000 can accurately measure the thickness of a film or coating down to atomic levels. In addition to measuring film thickness, J.A. WOOLLAM M-2000 can also be used to measure the index of refraction, optical transmission, absorbance, extinction coefficient and absorption coefficient of the sample. M-2000 is a multi-parameter optical tool, meaning that it can measure multiple characteristics from the same sample without the need for complex, time-consuming post-processing. It offers a wide range of sample holder sizes and can accommodate samples from 200mm in diameter down to 4.6mm in diameter. Additionally, its automatic calibration feature allows for easy setup and ensures repeatability of measurements. Equipped with a CCD camera, J.A. WOOLLAM M-2000 offers a high level of spectral resolution and allows for the characterization of samples in both the near-infrared and visible ranges. It also features temperature and external vibration controls, helping to minimize potential errors and ensure reliable results. M-2000 also offers higher flexibility and extended features when controlled by a computer, either directly or remotely. Overall, J.A. WOOLLAM M-2000 is an effective, reliable solution for optical characterization and measurement of thin films and materials. It uses sophisticated optical and software technology to accurately measure the optical properties of samples quickly and easily, making it an ideal tool for a wide variety of industries.