Used J.A. WOOLLAM M-2000 #9257200 for sale

J.A. WOOLLAM M-2000 ellipsometer is a device that uses polarized light to measure changes in the thickness of a sample material being analyzed. The measurement is done by first shining a light of a specific frequency onto a sample material surface before measuring the rotation of the resulting reflected light. The sample is placed on top of a sample disc enclosed in a UHV chamber, allowing for measurements to be accurately measured in a vacuum environment. The sample disc mounted on a rotating platform, allowing for different angles of incidence and polarization to be used for different measurements. The light source of M-2000 is a 147.5 nm ArF* laser with beam length of 2.0 cm and beam intensity of 10 nanoWatts/cm2. It is equipped with a CCD detector which is used to monitor sample polarization and assess the birefringence of the material. It also has a laser line and a laser interferometer, which is used to measure the amount of change in the polarization of the beam relative to the sample. The system also has an internal processor which processes the measured data and provides real-time results. It can also store up to 5000 curves for comparisons. Additionally, the system is also capable of long-term data acquisition and data analysis strategies, giving users an overview of the evolution of their film over time. The J.A. Wooellam J.A. WOOLLAM M-2000 is an effective tool for measuring changes in the thickness of sample materials, due to its ability to measure changes in the polarization at different angles of incidence. Additionally, the internal processor allows for data analysis and the ability to store curves, making it a useful tool for research and quality control. Furthermore, its ability to measure birefringence and its vacuum environment make it an ideal tool for specialized applications, such as in the field of optics.