Used J.A. WOOLLAM M-2000UI #9268961 for sale

J.A. WOOLLAM M-2000UI is a computerized ellipsometer designed to measure the optical properties of materials. It is capable of measuring the optical constants, thickness, and refractive indices of thin film materials with high accuracy and precision. M-2000UI has a strong range of capabilities, making it a valuable tool in materials research and production. J.A. WOOLLAM M-2000UI is capable of measuring thicknesses of thin films ranging from 0.2 nm to 3 µm. It is enhanced by the addition of an imaging system which allows for a better visual representation of the film characteristics. The measurements are taken on a range of materials using a variety of light sources, including polarized, unpolarized, and monochromatic light. The software used to operate M-2000UI is designed to be user-friendly, and it can be used to generate the measurement results quickly and reliably. It also allows users to evaluate film properties through a variety of methods, including multicomponent analyses, ellipsometric fits, and an integrated fitting column that can give consistent results. J.A. WOOLLAM M-2000UI also includes an advanced temperature control feature that will monitor and regulate temperatures within the precision range of 0.01°C. This feature is ideal for ensuring consistent results on a variety of materials, while also providing a more efficient process. M-2000UI also boasts an active vibration control system, allowing for measurements of samples that are susceptible to vibrations. With this feature, J.A. WOOLLAM M-2000UI offers great performance when it comes to measuring materials that are on the move. M-2000UI is an important asset to materials research and production. With its range of capabilities, it can measure the optical constants, thickness, and refractive indices of thin film materials with high accuracy and precision. Its user-friendly software and temperature control feature ensure consistent results, while its active vibration control system guarantees stability during measurement.