Used J.A. WOOLLAM M-2000UI #9277548 for sale

J.A. WOOLLAM M-2000UI is an advanced ellipsometer that has been developed to measure the optical properties of thin layers in precise detail. M-2000UI provides accurate data on refractive indices, layer thickness, absorption coefficients and crystalline orientation at different depths and angles. This helps to identify the physical properties of materials, such as semiconductors, polymers, coatings, and thin films. J.A. WOOLLAM M-2000UI consists of a polarizing device, a pair of attenuating plates, a silicon detector, and an optical stage. The wavelength can be varied from 253.6 to 700 nanometers, depending on the material being measured. The light is polarized and then split into two plane polarized components, which successfully analyze the optical properties of the layers. Data is then recorded and analyzed to determine information about the sample material. M-2000UI also has an integrated unit comprising a reflectometer, an optical microscope, and an adjustable power supply for adjusting the illumination level. This integrated unit grants users access to a variety of measurement techniques, providing in-depth information on the optical properties of various samples. J.A. WOOLLAM M-2000UI is a reliable, user-friendly machine with exceptional performance. It is easy to use and allows for rapid and accurate data processing. M-2000UI is suited to a variety of applications, including light scattering and thin-film growth, optical characterization, semiconductor diagnostics, multilayer optical coatings, optoelectronic devices, microwaves, mobile telecommunication, optical displays, chemical sensor characterization, and optical materials research. To enhance the performance of J.A. WOOLLAM M-2000UI, the data and analysis can be conducted in real-time, or the results can be processed in an offline mode. The embedded software can also be accessed remotely via a web interface, allowing users to access and manage their data from any location. Furthermore, the results can be easily uploaded in formats compatible with various software packages. M-2000UI is the pinnacle of ellipsometry technology and can be relied upon to offer precise, accurate analysis for all types of samples. This device has the capability to rapidly analyze and document the optical properties of diverse materials, making it an invaluable tool for many industries.