Used J.A. WOOLLAM M-88STD #293649572 for sale

The J.A.Woollam J.A. WOOLLAM M-88STD is an ellipsometer designed to provide accurate non-destructive thickness measurements of films as thin as 10 to 20 angstroms in thickness. The instrument is ideal for measuring the optical characteristics of thin films for applications such as thin film nitride coatings, anti-reflection coatings, and medical coatings for medical devices. M-88STD is a spectroscopic microscope that utilizes the principles of optical interference, reflection, and refraction to measure the optical characteristics of thin film materials. It consists of two modulated laser light sources (p-polarized and s-polarized), an analyzer, sample holder, and photo-detector. A laser beam passes through the sample and is focused by the microscope objective at an angle of incidence. A sample can be placed on the stage to measure the optical interference. The ellipsometer measures the optical characteristics of thin films by monitoring the change in polarization as the light passes through the interface. The light is split into a p-polarized beam and an s-polarized beam, and the polarization of the beams can be adjusted using the linear polarizer. The s-polarized beam is reflected off the sample to the analyzer and the p-polarized beam continues through the sample and is then modulated. The intensity of the light detected by the detector is used to calculate the optical characteristics of the thin film. J.A. WOOLLAM M-88STD can measure a variety of optical properties such as: optical thickness, refractive index, extinction coefficient, absorption coefficient, optical constants, and the finesse, or contrast ratio. The instrument has a maximum resolution of 1 angstrom and a wide dynamic range of 2 to 6 decades for most samples. The optical characteristics of the sample can be visualized in real time on the large LCD display. The instrument is also equipped with a range of analysis, data handling, and reporting features such as: easy to use software, multi-layer modeling, polarization analysis, and graphical display of results. M-88STD is suitable for applications such as semiconductor thin film deposition, microelectronics packaging, coating applications, chemical vapor deposition, thin film optical plastic coating, thin film functional sunscreens, and thin film sensing devices. The J.A.Woollam J.A. WOOLLAM M-88STD is a reliable and accurate instrument suitable for use in a wide range of research, development and industrial applications.