Used J.A. WOOLLAM RC2 #293627109 for sale

J.A. WOOLLAM RC2 is an advanced ellipsometer, designed to measure thin film structures and material properties. It is a high-end, laser-based equipment built to provide accurate and precise thickness, optical constants, and refractive index measurement results. RC2 is designed as a single unit which combines an optical head, a laser, a data acquisition system, an incident angle control device, and a goniometer into a single unit. This allows for measurements of samples at multiple angles, including up to six incident angles ranging from 70 degrees to 84 degrees in a single sequence. The optical head of J.A. WOOLLAM RC2 utilizes a machine of mirrors and lenses to focus the laser beam onto the sample. The laser tool contains a diode-pumped solid-state laser, which is capable of producing a variety of wavelengths for different experiments. The goniometer is used to rotate the sample relative to the laser to ensure that the measurements are repeatable and accurate. RC2 also features an advanced angular measurement and data acquisition asset, which allows for simultaneous acquisitions of the sample reflection parameters at up to four incident angles with a resolution of 0.1 degree. This allows for repeatable and accurate measurements of thin film structures and material properties. J.A. WOOLLAM RC2 provides excellent accuracy and precision of in thickness and optical constants measurements, as well as being able to measure at different wavelengths and different incident angles simultaneously. This makes it an excellent choice for a variety of thin film structure and material property measurements. It is capable of measuring a variety of materials from highly reflective oxides to transparent semiconductor materials, which makes it an invaluable tool for research and development.