Used J.A. WOOLLAM VASE #293624629 for sale

J.A. WOOLLAM VASE was designed and manufactured by the Woollam Company, an industry leader in ellipsometry. The patented VASE is a precision optical tool designed to measure the thickness and optical constants of thin films on a variety of substrates. Using an incident angle range from 4 to 70 degrees and an accuracy of 0.2 degrees, J.A. WOOLLAM VASE offers unmatched accuracy in its measurements. Its unique design includes a removable lower unit with the air bearing and the film sample mount that allows for the measurements of multiple thin films with just one setup. The optical head includes a specially designed optics envelope to reduce air-reflection errors and minimizes changes in the optical path between incident and scattered light for improved accuracy. The software included with the equipment offers intuitive functions that allow for full feature analysis and rapid data collection. VASE offers unparalleled accuracy in thin film thickness and optical property measurements. Its advanced software allows for comprehensive analysis and rapid data collection, enabling researchers to quickly conduct conformity testing of thin-film samples. The system utilizes a low-vacuum incident angle ranging from 4 to 70 degrees that is adjustable with 0.2-degree accuracy. This enables users to measure thin films with high precision. Improved optics envelopes also reduce air-reflection errors and minimize optical path deviations, yielding more accurate results. The unit is further aided by the sophisticated detection systems built into J.A. WOOLLAM VASE. These include the Peltier temperature controller, the Autophobic Flatten Compensation software, and the automatic modulation compensation feature. With these systems, users can quickly and accurately measure thin films of different optical constants and films with micro-roughness. This guarantees accurate and precise measurements and improved thin film characterization, especially when used in conjunction with the machine's advanced software. VASE is a versatile and advanced ellipsometer that offers unprecedented accuracy in thin film measurements. It is especially beneficial for researchers and scientists in materials science, photovoltaic, electronics, and semiconductor markets, as well as for use in wavelength dependent optical material determination. This innovative tool can be used to measure the thickness of thin films and the optical constants of a variety of substrates, with an accuracy and repeatability that is simply unrivaled.