Used J.A. WOOLLAM VASE #9224810 for sale

J.A. WOOLLAM VASE is an ellipsometer that is used to measure optical properties of materials. This device provides the user with accurate optical information such as film thickness, refractive index and extinction coefficient of the film as well as the optical properties of the underlying material. VASE is ideal for the determination of thin film properties on flat, optical surfaces. It can be used for applications ranging from silicon wafers to metal, glass, plastics, and paints. The Woollam J.A. WOOLLAM VASE consists of an industrial-grade spectroscopic ellipsometer, collimation optics, laser diode light source, electronics, computerized user interface, and rotary stage. The device is capable of performing a wide range of ellipsometry and reflectometry measurements through the use of different detection modes. It includes single wavelength, multiple wavelength, multiple angle, and temperature-dependent measurements. The laser diode light source is used to illuminate the sample to be measured and is guided by collimation optics to a polarized beamsplitter. The beamsplitter divides the light into two orthogonal polarization components and then sends them to two separate detector arms. The detectors measure the polarization of the reflected light and the rotational stage is used to rotate the sample in increments to perform the measurement. The data collected by the two detectors are used to calculate the complex reflectance and transmittance of the material. This data is then processed by the computerized user interface to determine the index of refraction, thickness, and optical constants of the sample material. The results are displayed on the interface in both numerical and graphical formats as well as providing diagnostic information for further analysis. VASE is an excellent device for optical analysis of materials with its wide range of measurement modes and accuracy. This device is perfect for applications such as thin film characterization, deposition, and corrosion studies. It can also be used for other applications such as surface roughness, adhesion, and light scattering measurements.