Used MIZOJIRI DHA-XA2 #293648634 for sale

A MIZOJIRI DHA-XA2 is a type of ellipsometer designed to measure the optical properties of thin film materials. The device uses a monochromatic laser source and a set of detectors to measure changes in the polarization state of reflected light in a sample material. This allows for the measurement of the optical properties of thin and thick materials. DHA-XA2 consists of two main systems. The first is the sample chamber. At the center of the chamber is a sample stage, which is where the sample material is placed. The sample stage is able to rotate in two dimensions in order to measure the changing angle of incidence of the incoming light. The second system is the optical system. This system consists of a laser source, which is used to create a beam of monochromatic light. This beam is then focused on the sample material via a set of lenses. The laser is then able to measure the polarization state of the light that is reflected off the sample material. The output of MIZOJIRI DHA-XA2 is the data it produces, which can be used to calculate the optical properties of the sample material. This data can be used to measure the index of refraction, thickness and optical constants of the material. The device can also measure the dispersion of the material which can be used to calculate other optical properties. DHA-XA2 is a highly accurate instrument that has been used in various research and development projects. Its ability to measure the optical properties of materials allows for a wide range of applications, such as thin film research, material characterization and optical design. The device can also be used for a variety of industrial applications, including semiconductor manufacturing, optical media production and quality control. Additionally, it can be used for optical coating and multi-layer thin film optimization.