Used PHILIPS SD-3400 #9163651 for sale

PHILIPS SD-3400 is an advanced ellipsometer technology device used in surface characterization experiments, such as optical thin-film modeling. The SD framework uses a monochromatic polarizer and detector to measure the two parameters of the light's electric field vector: the amplitude and phase. Both parameters are measured over a range of angles of incidence, which allows for the mapping of material optical properties. PHILIPS SD 3400 is equipped with a low-intensity HeNe laser source which provides a wavelength of 632.8 nm, and a CCD detector. SD-3400 can function with a range of sample types, including, but not limited to, thin films characterized by their refractive index, optical coating thickness, or internal film layers. Furthermore, SD 3400 can also measure multi-layer materials, preferred measuring targets for material optical characterization. PHILIPS SD-3400's cutting-edge design is embodied by its combination of an ultra-precise 5-axis goniometer with an aperture setting, low mechanical stress utilization, and electronic focusing. In addition, its state-of-the-art mirror mounting techniques provide increased tilt ranges and extended life against adjustments of the goniometer optics. PHILIPS SD 3400 also offers a broad range of process and analysis software to obtain surface parameters of the sample material, including advanced data handling and presentation features, advanced optical modeling, and the ability to design custom experiments. SD-3400 is an extremely accurate tool for material characterization, as proven by its scanning linear accuracy of 0.001°. This high-quality device offers high stability for its applications, a PC compatible user interface for data handling, and a powerful optical monitoring system that ensures even more results. Furthermore, its design also provides a number of optional configurations, including vibration isolation, dual channel measurements, and noise reduction. SD 3400 is the ideal tool for analyzing materials, measuring optical properties, and characterizing thin films. Its cutting-edge design and state-of-the-art features ensure superior results, making it an exceptionally efficient device in an array of applications.