Used PHILLIPS SD-3400 #9221001 for sale

PHILLIPS SD-3400 Ellipsometer is an automated single-sample spectroscopic instrument designed to measure optical properties of thin-film layers, such as thickness, refractive index, and other optical parameters. SD-3400 Ellipsometer has a highly automated operation with a user-intuitive graphical interface that allows the user to quickly enter parameters, measure multiple samples with different angles and wavelengths, and generate up to 4 curves at once. The instrument utilizes sequential polarized light source and detector for accurate measurement of angles and intensities of the light scattered from samples. It also has an integrated CCD camera that can be used for image capture and display. The detector module is located in the measuring chamber to provide a high degree of accuracy. PHILLIPS SD-3400 Ellipsometer can also be utilized for a wide range of research and industrial applications, including thin-film deposition and characterization, protective coating, photovoltaic cell performance testing, anatase layer deposition characterization, semiconductor wafer device characterization, and optical component analysis. It is capable of measuring thickness, optical constants (refractive index, absorption coefficient, extinction coefficient, absorption cross section, etc.), absolute layer thickness determination, optical properties of nanostructures, and ellipsometric parameters. The system is designed with a double-beam configuration, which features an incident and a scattered beam. This design increases precision and accuracy of the optics, particularly when used in combination with the built-in rotation analyzer. SD-3400 Ellipsometer can also be integrated with a variety of laser sources which significantly extends its applications. It also has a closed-loop temperature control system, which is necessary for the study of temperature-dependent optical properties of the samples. PHILLIPS SD-3400 Ellipsometer is an effective tool for the characterization of organic and inorganic thin-film materials. With its easy-to-use graphical interface, the instrument can measure and analyze the optical properties of samples quickly, making it a preferred choice in the industry. It is well suited for the research and characterization of optical components, protective coatings, photovoltaic cells, and semiconductors.