Used PLASMOS 2300 #131672 for sale

PLASMOS 2300 is a professional, state-of-the-art Ellipsometer equipment used in research and development, as well as production quality control. The instrument measures the change in state of polarization of light scattered off a sample's surface to gain information about the film thickness, concentration and optical constants. The light emitted by 2300 is tailored through a continuously variable polarization state generated by two high quality Pockels cells and a Zero-Order waveplate. The power of PLASMOS 2300 and its fast response time make it an ideal choice for production and research applications. 2300 is a complete scanning Ellipsometer system with a wide field of view focusing unit, an integrated computer and dedicated software. The instrument includes a CCD camera with 256x256 pixels resolution and 0.3mm line spacing. This camera is used to accurately measure the changes of intensity of scattered light across the scattered plane. The software provided with the machine allows users to easily control and monitor the scanning optical tool. PLASMOS 2300 is highly sensitive to small constructive and destructive interference patterns providing a high accuracy and repeatability in determining optical constants of thin films, as well as their thickness. With its broad spectral range, the asset allows measurements from ultraviolet (190nm) to visible (755nm) and near-infrared regions (1070nm) in a single measurement. The angular resolution of 2300 is an excellent 0.2°. This feature allows researchers to get high resolution data and obtain the desired information quickly and easily. Furthermore, the instrument can take multiple measurements at desired angles of incidence in order to obtain more accurate results. PLASMOS 2300 measures in Reflectometry and Transmittance. In Reflectometry, the instrument measures the polarization plane change of scattered light due to the multiple reflections of beam on the sample surface. On the other hand, in Transmittance, the sample is illuminated and when light passes through the film, the measurement takes place based on the properties of the sample and polarization plane change of scattered light. 2300 has the unique capability to measure both Reflectometry and Transmittance simultaneously in the same measurement. This allows users to monitor film thickness and composition on the same sample, thus providing a more accurate result. Overall, PLASMOS 2300 is a powerful and high-performance Ellipsometer model. It provides researchers and professionals in the field of material science with an accessible instrument used to measure the optical properties of thin films,. With its broad spectral range and sensitive measurements of polarized light, 2300 is the ideal choice for advanced research.