Used PLASMOS SD 2000 #293621181 for sale

PLASMOS SD 2000 is an ellipsometer, a type of characterization tool used to measure the thickness and optical properties of thin multilayer film on substrates. It measures the polarisation change of a single laser as it propagates through a thin film and substrate stack. This technique is non-destructive and provides extremely precise results with an accuracy of 0.1-1 Å in thin film thickness and within 0.1-2° in optical parameters. SD 2000 utilizes low-cost, high-power laser sources, adjustable monochromator that optimize spectral resolution, and single or multiple detectors. PLASMOS SD 2000 offers a wide operating spectral range from 350-1750 nm in one or two laser wavelengths. This system is equipped with a unique Dual Detector™ technology in which two detectors, both measuring on a single sensing head, measure the reflected light at two different angles. This allows simultaneous measurement of double-interface samples and three-layer samples. The system also offers multiple auto-modes, providing the capability to analyze thick samples, high-reflection samples, and even warped surfaces. The data acquisition process is extremely fast, allowing users to acquire data and generate meaningful results in a fraction of the time usually required. SD 2000 features a range of advanced software tools adapted to the analysis of thin film samples, including dedicated software for the characterization of a variety of substrates, films and layers. It includes a proprietary module that allows custom measurements of optical constants and layer functions. PLASMOS SD 2000 also offers special modules for advanced absolute measurement of single and double layer film thickness and layer refractive index. SD 2000 is designed for a broad range of laboratory and production applications, including thin film optical coatings, semiconductor device fabrication, deposition process control, display materials, magnetic media, and more. It is suitable for a variety of substrates including glass, ceramics, silicon, quartz, plastics and paper. Its precision, accuracy and versatility make it a preferred tool for quality control, research and development facilities.