Used PLASMOS SD 2000 #9010339 for sale

PLASMOS SD 2000 is an automated computer-controlled ellipsometer, which is used to measure thin film materials. It is an advanced optical instrument that uses light to measure the optical properties of thin films and thin-film components. The ellipsometer utilizes polarized light to measure the optical characteristics of a sample. The light is projected onto the sample, and some of the light is reflected off the sample surface. The reflected light is analyzed and the polarization state of the light is measured. From this, one can obtain information about the material's thickness, optical constants, and other optical properties of the sample. SD 2000 has a broad operating range of 350-1700 nanometers with a maximum resolution of 0.01 degrees, so it's suitable for use with thin film materials of very high precision. The ellipsometer has a variability range of 0.2 to 10 nanometers on the film's thickness, and has a packing density of 10%, which is useful for studying very thin layers. PLASMOS SD 2000 also provides advanced programming functions, such as adjustment of the sample angle and sample polarization. The software includes a wide range of standard film models, which can be selected to calculate the sample's optical properties. The entire operation of the device is automated and controlled by the PC computer, which allows the operator great flexibility in performing measurements. The user can control various parameters such as the polarization angle, power, wavelength, and more. SD 2000 is ideal for testing thin film materials for lateral homogeneity, optical constants, absorption, retardation, and thickness in a variety of applications, such as optical coatings, transparent conductors, epi-layers, optics, and much more. Thanks to its advanced features and capabilities, PLASMOS SD 2000 offers great convenience and accuracy for performing reliable measurements.