Used PLASMOS SD 2000 #9117315 for sale

PLASMOS SD 2000 is a state-of-the-art ellipsometer designed for research and industrial use. It is capable of capturing very precise measurements of the optical properties of materials over the wavelength range of 190 nm to 2100 nm. In addition, it has a high sensitivity over the full angular range, allowing measurements to be made with greater accuracy and precision. The instrument is powered by advanced software that allows for full automation of measurements to reduce user error. SD 2000 consists of an optical head connected to a computer display. The optical head houses a polarized light source, modulator, detector, mirror, and monochromator, which are all precisely aligned and controlled by the software. The device is designed to allow for easy integration and operation with a variety of control systems. It also includes a built-in file storage system, as well as an intuitive and user-friendly graphical user interface for easy use and operation. The measurements PLASMOS SD 2000 is capable of are extremely accurate and precise. A high signal-to-noise ratio is achieved using advanced thermoelectric cooling and superior signal modulation, ensuring the most reliable data possible. In addition, the device is able to measure a variety of sample types including single and multi-layer coatings, wafers, nanoparticles, nanotubes, and other materials. SD 2000 is an incredibly powerful and versatile instrument, allowing for custom configurations and parameter settings. It supports a range of high-level software applications, such as data acquisition, control, data analysis, and report generation. All of which are essential for successful ellipsometer analysis. Furthermore, the device has an automatic light irradiance calibration system, which allows for the most reliable and accurate measurements. In conclusion, PLASMOS SD 2000 is a highly advanced and sophisticated ellipsometer designed for research and industrial use. With its precise measurements and high-level software application support, it provides reliable and accurate data on the optical properties of samples over a wide range of wavelengths, angles, and geometries.