Used PLASMOS SD 2002 LR #31485 for sale

PLASMOS SD 2002 LR
Manufacturer
PLASMOS
Model
SD 2002 LR
ID: 31485
Ellipsometer.
PLASMOS SD 2002 LR is an ellipsometer, a device used to determine the thickness and optical properties of thin films over a wide range of materials. It has been designed with the highest optical sensitivity and repeatability, providing reliable and accurate results. SD 2002 LR utilizes an optically variable continuously variable wavelength (CVW) laser source and a non-polarization optics system. This enables it to analyze thin films and multilayer structures of up to 144 layers. The non-polarization optics also improves signal-to-noise ratio and sensitivity, providing improved accuracy and precision. A silicon photo diode detector and a position sensitive diode (PSD) detector, both based on optical-heterodyne principles, are used to measure the ellipsometric angles. These measurements are then processed through a computer program to determine the optical constants of the analyzed material. PLASMOS SD 2002 LR has a wide range of features which make it ideal for a variety of applications and industries, including automotive, optical disc burners, optical component manufacturers, and surface science. The device has automated functions for wafer-level real-time monitoring and quality control. This reduces the need for inspection and manual material handling, resulting in higher product quality and lower inspection costs. The device can be used for simple experiments or complex integrated measurements such as layer-by-layer mapping. Additionally, SD 2002 LR is compatible with a range of sample stages, including standard XY stages, XYZ stages, rotation stages, tilt stages and microscope stages. This flexibility allows it to be integrated with other equipment, allowing for the analysis of a wide range of samples. Overall, PLASMOS SD 2002 LR is a versatile device with a wide range of features. Its optically sensitive design, combined with its automated functions, enables it to provide accurate measurements of thin films and multilayer structures over a wide range of materials. The flexibility and compatibility of the device ensure that it can be used for a variety of application and is perfect for use in industries such as automotive and optical component manufacturing.
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