Used PLASMOS SD 2002 #98775 for sale

PLASMOS SD 2002 is an ellipsometer developed by SDC Co. Ltd. as a part of their SPIDER (Spectroscopic Polarization Interferometer with Ellipsometric Detection) family of products. It is a state-of-the-art spectroscopic ellipsometer designed for the study of ultrathin films and nanomaterials. Using polarized light, SD 2002 measures the parameters of an optic's surface, such as its Brillouin line shape, thickness, refractive index, and absorption coefficient. This allows for an in-depth analysis of the structure and optical properties of materials on the nanoscale. PLASMOS SD 2002 utilizes a patented dual-beam grating for quick, high-precision measurements of samples. It also features a top-loading sample chamber, enabling rapid sample loading/unloading. SD 2002 has a detection dynamic range of 0.1 to 10000 degrees angles of linear polarization, and its accuracy is better than 0.02 degree in the nanometer regime. The device supports polarization angles in the range of 0 to 360 degrees. PLASMOS SD 2002 can detect second and third harmonic signals, thus allowing simultaneous acquisition of film thickness, refractive index, and absorption coefficient. It can also be used to determine an accurate estimate of the sample's optical constants. In addition, the device supports a high degree of portability, allowing it to be taken to the various research institutes and laboratories around the world. Its integrated software enables researchers to easily control the instrument in the lab or view results remotely. SD 2002 is a versatile tool for materials, physics, chemistry, and engineering applications. It offers high accuracy, speed and a reliable means of characterizing the optical properties of nanomaterials. As such, it has become an essential tool for any laboratory involved in the research of thin films and nanomaterials.