Used PLASMOS SD 2003 #293654305 for sale

PLASMOS SD 2003 from Edinburgh Instruments is a semi-automated, ultra-precise spectroscopic ellipsometer, designed to measure optical and material properties of a surface quickly and accurately. It is an advanced tool for characterizing polar property parameters and conducting surface analyses for a wide range of materials and applications. The platform utilizes o-polarized, null and normal light sources, along with polarizers, compensators and double monochromators to analyze the change in state of polarization of light as it reflects off a sample under specified conditions. The sample light is then detected and computed in a highly sensitive, linear fashion by a lock-in amplifier. The instrument has manually adjustable ellipsometric angles of Ψ and Δ, adjustable sample heights of 0-60 degrees along with four incident angles of light: 72.5, 75, 77.5, and 80 degrees. SD 2003 also provides data about a range of properties such as angle of incidence, angle of reflection, refractive indices, thin films layer thicknesses, surface roughness, and more, with a precision of 0.001°. Additionally, a variety of software packages can integrate with the instrument to further customize data collection and analysis capabilities. These powerful tools, along with quick response time and easy-to-use controls, make the device suitable for a diverse set of applications, such as in optical laboratories, research institutions and semiconductor industries. Furthermore, the instrument has a compact footprint making it suitable for tabletop use, as well as automated data storage, collection and preparation capabilities. It can be used with a variety of sample types, including small pieces, thin films, coated surfaces and wafers. Due to its versatility and accuracy in the characterization of surfaces, PLASMOS SD 2003 is invaluable for many applications, from industrial testing to materials science to pharmaceutical analysis.