Used PLASMOS SD 4000 #9079135 for sale

PLASMOS SD 4000 ellipsometer from Tokyo Seimitsu Co., Ltd. is a comprehensive, comprehensive and highly sensitive ellipsometric measuring system capable of measuring a wide variety of parameters in a broad range of applications. This device is renowned for its fast and accurate measurement, high resolution imaging, and low cost. SD 4000 features a range of high-resolution imaging components. It consists of a microscope unit, a polychromator, a polarization analyzer, a Wollaston prism polarizer, and a detector. The microscope is equipped with a high-resolution imaging camera and video recorder that offer a wide array of view sizes, magnifications, and fields of view. This unit is able to visualize various samples and substrates without contact, offering quick and efficient measurements. The polychromator and polarization analyzer perform accurate reflectance, transmittance and surface analysis differentiation with high wavelength resolution. The Wollaston prism and the polarization analyzers provide polarization-controlled measurements with fast response, while the detector and video recording unit further enhance the flexibility and accuracy of PLASMOS SD 4000. SD 4000 also features a large collection of software tools, including an interactive software user interface, an automatic tool for parameter extraction, and a variety of supporting software for data acquisition, analysis and manipulation. Furthermore, a library of material properties and related databases are available for use with the software, allowing researchers to customize their measurement needs and to store their data profile into the memory of the system. PLASMOS SD 4000 provides excellent reliability and performance, offering manual operation with the integrated controller or a PC-based software for automated operation. Overall, this device is a highly reliable and flexible solution for ellipsometric measurements, and it is suitable for various applications such as organic material characterization and surface analysis.