Used RUDOLPH / AUGUST S300 #9314233 for sale

RUDOLPH / AUGUST S300 is a user-friendly, automated optical ellipsometer which is designed to measure and analyze thin film layers and substrates. It utilizes an innovative patent-pending design to provide an accurate and reliable ellipsometric analysis. AUGUST S300 is an excellent solution for both research and production applications in materials science, optics and photonics fields. This model has been designed with a simple user interface and automated operation which enables even novice users to quickly become expert users. RUDOLPH S300 offers a fast and stable environment for ellipsometric analysis. Its fast measurement speed, coupled with an easy to use software package enables users to quickly and accurately measure thin films or surfaces, and obtain precise spectral and angular Ellipsometric Parameter (E-parameter) data. S300 operates with two different types of polarizers; a Compensated Variable Retarder (CVR) polarizer and a half-wave plate. These allow the operator to analyze both s- and p- polarization. RUDOLPH / AUGUST S300 also includes a true variable wavelength system which has a range from 250 to 1300nm. This allows the user to analyze substrates and thin film properties with a wide range of features. It is possible to analyze a variety of materials and surfaces such as polymers, metals, semiconductor materials, dielectrics, magnetics, and composites. Furthermore, AUGUST S300 can automatically adjust the wavelength and razor angle settings according to the user defined values. RUDOLPH S300 utilizes a sophisticated fitting algorithm that enables the user to extract the qualitative optical parameters of thin films or surfaces layers. The model also provides a comprehensive set of powerful graphical and numerical tools for analysis, modeling, and reporting. S300 is a high quality, feature-rich and cost-effective ellipsometer. With its ease of use and intuitive operation, RUDOLPH / AUGUST S300 is the ideal tool for professionals in a variety of industries.