Used RUDOLPH / AUGUST S300 #9355325 for sale

RUDOLPH / AUGUST S300
Manufacturer
RUDOLPH / AUGUST
Model
S300
ID: 9355325
Wafer Size: 12"
Vintage: 2007
Macro defect inspection system, 12" 2007 vintage.
RUDOLPH / AUGUST S300 Ellipsometer is a highly precise device used for thin-film coatings and materials analysis. It measures the change in light polarization as it passes through the material or coating, and is highly accurate in determining the film thickness and optical constants. AUGUST S300 Ellipsometer is a combination of the advanced electro-optical Trouton reflections ellipsometer and AUGUST NanoSpectrometer™. This combination provides excellent performance and characterization of a single ultra-thin layer from 0.02 nm to 1 µm. It has a built-in wavelength range of 190-930nm. The ellipsometer features computer-controlled operation, manual operation for routine reliance measurements, and a "Basic" token showing the status of the system and the last measured result, angle of incidence, thickness of the film layer, and quality factors. RUDOLPH S300 Ellipsometer also includes a special calibration feature that enables the user to accurately calibrate the effects of sample drift and light source drift. The calibration is accomplished in only one minute due to the use of a two-axis rotary stage, which minimizes potential alignment errors. S300 Ellipsometer is used in research laboratories to study the properties of thin films and optics, as well as in the development of new materials. It has been used in fields such as chemical and physical analysis of single and multilayer coatings, investigation of transparent and semi-transparent media, and characterization of films from different materials like metals, oxides, organic polymers and inorganic materials. RUDOLPH / AUGUST S300 Ellipsometer is designed to be insensitive to external influences such as vibrations, temperature, and environmental dust. Additionally, it does not require the use of hazardous liquids like other ellipsometers do. AUGUST S300 Ellipsometer is an excellent choice for research laboratories that require high precision metrology in the study of thin-film coatings. Its precision and accuracy, combined with the efficient calibration, make it a great choice for any laboratory requiring accurate data.
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