Used RUDOLPH / AUGUST Ultra II #9285847 for sale

RUDOLPH / AUGUST Ultra II ellipsometer is an advanced, high-precision instrument used to measure the optical properties of thin films and thin-film dielectrics. It uses polarized light to analyze both the interface between the thin film and its substrate, as well as changes in the optical properties of the thin film (such as refractive index, extinction coefficient, and thickness). AUGUST Ultra II ellipsometer combines cutting-edge technology with both user-friendly and customizable software interfaces for data acquisition and analysis. The device utilizes both the Mueller-matrix Ellipsometry (MME) and Spectroscopic Ellipsometry (SE) techniques in order to obtain more accuratefilm measurement and characterization results than traditional scatterometry methods. RUDOLPH Ultra II has a number of innovative components that distinguish it from other ellipsometers. It utilizes three orthogonally polarized beams of light, allowing for the simultaneous measurement of both the amplitude and/or phase-shift of the ellipsometric ratio parameters (delta and psi). In addition, it incorporates an automated focus system to ensure a clear image of the sample under test and automatic background correction for improved signal to noise ratio. The software platform provided with the system also makes for accurate and repeatable data acquisition as well as detailed analysis. It offers user-friendly menus for data input and configuration, a data acquisition wizard that walks you through the process of setting up a series of measurements, and a graphical user interface (GUI) to graphically evaluate the data in real-time. Finally, Ultra II boasts an array of accessories and upgrade options, such as a range of sample holders, motorized stages, imaging systems, and a UV/vis/nIR spectrometer. All of these components increase the versatility and functionality of RUDOLPH / AUGUST Ultra II ellipsometer, making it an optimal choice for any application that requires accurate measurements of thin film thickness and optical properties.