Used RUDOLPH AUTO EL II #293609047 for sale

RUDOLPH AUTO EL II is an automated ellipsometer from RUDOLPH Technologies, Inc., that can measure thin-film thickness, optical constants and film stress. This equipment is based on the principles of polarized light ellipsometry (PLE). It is a non-destructive optical technique that can measure very thin films, with thickness in the range of 10 to 1000 nm, on a diverse range of substrates such as semiconductors, metals, glass and polymers. AUTO EL II utilizes a polarized light source and a rotating polarizer to generate a beam of light which is initially linearly polarized. The light is then reflected from or transmitted through the sample surface and detected by a detector. The detector measures the polarization state and intensity of the light beam after it reflected off or passed through the sample surface. The intensity and polarization state of the reflected beam are compared to the intensity and polarization state of the incident beam and the ellipsometric parameters ψ and δ are derived. The presence of a thin film on the sample surface affects the intensity and polarization state of the reflected light, as compared to the incident light. This information can then be used to calculate the refractive index, thickness and optical constants of the sample. The advantages of RUDOLPH AUTO EL II over other ellipsometry equipment include increased accuracy due to a higher frequency LED light source, faster measurement time due to an automated polarimeter and an innovative user interface for easy operation. The ellipsometer is compatible with RUDOLPH Windows-based interactive software, which enables data logging, plotting, export and storage. This equipment is widely used for industrial, academic and research purposes in many industries such as semiconductor, optoelectronics, nanotechnology, life science, optical metrology and research labs. It has also been used in the production and manufacture of thin films, coatings, and optical elements. Overall, AUTO EL II is an advanced ellipsometer that provides reliable and accurate optical material characterization in various applications. It utilizes high precision performance and maximizes the measurement speed and accuracy. In short, it is the go-to solution for thin film characterization.