Used RUDOLPH AUTO EL II #293618566 for sale

Manufacturer
RUDOLPH
Model
AUTO EL II
ID: 293618566
Wafer Size: 6"
Vintage: 1983
Ellipsometer, 6" 1983 vintage.
RUDOLPH AUTO EL II is an optical ellipsometer produced by RUDOLPH Research Analytical for thin-film characterization. It works by illuminating a thin film sample with a beam of polarized light and measuring the polarization of the reflected or transmitted light. AUTO EL II uses polarization modulation, which enables simultaneous measurements of both the amplitude and phase of the sample's optical response, allowing for a full description of the thin film's optical properties. The device is designed to be fast and user-friendly, and has a range of features to maximize accuracy and fluency of operation. RUDOLPH AUTO EL II utilizes a 0.5 milliwatt HeNe laser to provide a beam of light that is reflection- or transmission-illuminated to the sample under study. A beam scanning system, which contains two galvanometric mirrors, directs the beam through an Acoustic-Optical modulator and then to the sample, and any reflected or transmitted light is then measured via an infrared detector. The modulation scheme is a PC-controlled 4-state polarization modulation that is used to measure the polarization state of the incoming and outgoing light. TheAuto EL II is equipped with a variety of features for optimizing accuracy and efficiency, including a high-resolution stepper motor drive that provides an operating wavelength range of 633 nm to 700 nm, a high-dynamic range detector with simultaneous measurement of s and p polaroids, and a sample stage that can control motorized XY motions as well as manual movements using a joystick, enabling a wide range of sample field-of-views to be studied. AUTO EL II provides powerful software tools, such as RUDOLPH Films Pack, Bulk Solutions Pack and Substrate Solutions Pack, which allow for easy analysis and reporting of sample results obtained with a few simple steps. Additionally, the included POL-EL software suite provides additional analysis tools, such as leaky mode analysis and film mode analysis, allowing investigators to perform further analysis of their data. Overall, RUDOLPH AUTO EL II is an effective and powerful optical ellipsometer designed to allow users to quickly and accurately characterize thin film samples. Its combination of optical scanning and modulation, together with high-end software tools and stage motorization, ensure that it is capable of providing precise measurements and interpretations of thin film samples.
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