Used RUDOLPH AUTO EL II #293626850 for sale

RUDOLPH Auto Ell II is a high performance ellipsometer designed for precision surface characterization. The Auto Ell II is a full-featured instrument for both manual and automated operation and remote access. It is fully automated, providing the user with ease of use and rapid acquisition of data from a wide variety of surfaces. The Auto Ell II is equipped with a CS400 controller, a vertical goniometer, a horizontal rotating ellipsometer, a horizontally angulated detector head, and a total internal reflection (TIRFM) cell. The goniometer is used to scan the sample in a single direction and measure both its reflection and ellipsometric parameters. The rotating ellipsometer is used to scan the sample in multiple directions to produce a complete map of the sample's surface features. The angulated detector head is used to measure the sample's reflectivity in a range of incident angles and polarization directions. The TIRFM cell is used to measure the effect of surface scattering or surface roughness on the sample's properties. The Auto Ell II is capable of measuring ellipsometric parameters and optical constants such as and extinction parameters, dielectric constants, refractive indices and thin film coating thickness over a range of wavelengths, incident angles and polarization directions. The instrument can measure both reflection and transmission type materials and is capable of maintaining a high degree of accuracy with a wide range of materials and samples. The Auto Ell II integrates a 6" and 8" sample case mounted on the goniometer, enabling the measurement of large and small samples. The Auto Ell II includes a Rockwell Modell Controller, a 20" monitor, optical microscope, and a set of translation stages for sample translation in the x-y plane. The controller includes a WinNT/XP-based operating system, a Ethernet/Internet connection, a video switcher, a high speed image processor, a Peltier-style object stage, a digital electronic positioning system, 10 gigabytes of hard disk storage, a four slot data acquisition board and software, a thermoelectric cooling system and power supplies, and a 12-bit analog-to-digital converter. The Auto Ell II is a widely used instrument for precision characterization of advanced materials and is particularly useful for thin film analysis and metrology. It is an easy to operate and cost-effective tool for research, industrial and educational purposes.