Used RUDOLPH AUTO EL II #293630320 for sale

RUDOLPH AUTO EL II is a high-precision, digital ellipsometer designed to measure thin-film properties such as thickness, optical anisotropy, refractive index, and extinction coefficient, as well as deposition rate. It is a non-destructive, contactless surface analysis technique commonly used in the research and development of semiconductor materials, optical coatings, and thin-film stacks. AUTO EL II is a self-contained system that includes a computer-controlled optical module, a sample manipulation stage, a monochromator, a software-controlled mechanical arm, and a spectrometer. With the lightweight and compact optics module, RUDOLPH AUTO EL II has the capability to detect ultrathin film structures down to 2nm thickness. The sample manipulation stage is capable of automatically scanning samples with a wide range of sizes, including large area (300mm) substrates, allowing for measurements over multiple sample areas. The monochromator is equipped with monochromatic filters, allowing for measurement at wavelengths from 190nm to 1000nm. The software-controlled mechanical arm ensures the correct positioning of the optics module relative to the sample, while the spectrometer is used to measure the energy reflected off the surface. AUTO EL II is easy to use and the intuitive software-controlled user interface helps streamline sample measurement. Parameters such as wavelength and orientation can be programmed and fine-tuned for each sample. Additionally, the software allows users to store test results, adjust analysis parameters, create custom measurement sequences, and use automated scripting language to control the experiment. RUDOLPH AUTO EL II is a powerful, versatile tool for thin-film analysis. With its high-precision optics, software-controlled operation, and capability of measuring thin layers down to 2nm thickness, this advanced ellipsometer is an ideal choice for researchers and engineers working in the field of thin-films and semiconductors.