Used RUDOLPH AUTO EL II #945 for sale

RUDOLPH AUTO EL II is a comprehensive automated optical ellipsometer for measuring the optical properties of a wide range of materials. It is a confocal optical microscope that uses a rotating polarized light source and an adjustable analyzer to measure thin film thin film layers and the surface of a substrate in the same plane. The sophisticated optical design of AUTO EL II utilizes a laser-based approach to facilitate high accuracy and reproducibility in reflectance and ellipsometry measurements. RUDOLPH AUTO EL II's ellipsometer is equipped with a range of optical components, including a rotating source wheel, a movable Mueller polarizer, a beam splitter, a cross-polarizer, and a high numerical aperture (NA) condenser. By using a combination of these components, it is possible to measure the complex polarization of light caused by the thin film and substrate materials. The data produced by AUTO EL II is expressed in terms of a Mueller matrix, which allows for a characterization of both the thin film and substrate parameters. RUDOLPH AUTO EL II's optical configuration greatly increases the accuracy and repeatability of ellipsometric measurements. Its unique operating parameters allow for a smooth transition between angular and deflective ellipsometry modes, enabling analysis of any thin film and substrate interactions. This maximizes the repeatability of the conditions and results, eliminating any potential error that could be caused by changes in the measurement parameters. AUTO EL II can also use a variety of wavelengths, making it suitable for any measurement application. Its variable light source and sample motion capabilities allow for custom user-specified parameters to be entering and adjusted for different measurement conditions. Furthermore, the software of RUDOLPH AUTO EL II provides a wealth of features and options, allowing users to check measurement accuracy and reproducibility, synchronize photos and thin film measurements, and save data for further analysis. AUTO EL II is a versatile optical ellipsometer that provides high precision and repeatability in thin film, thin liquid, and thin substrate measurements. Its comprehensive range of optical components, together with its adjustable variables, software features and quality components, make it an ideal tool for any scientific or industrial characterization application.