Used RUDOLPH AUTO EL III #293604275 for sale

RUDOLPH AUTO EL III is a high-performance, fully automated ellipsometer from RUDOLPH Research Analytical. This ellipsometer measures both thickness and refractive index of thin films on a variety of substrates. It is suitable for materials ranging from plastics and optics to semiconductors and thin metal films. With its motorized rotary stage, this instrument allows for precise angular measurement for accurate results. RUDOLPH AUTOEL III utilizes a laser interferometry system, which eliminates the need for manual alignment and allows for automated operation, eliminating operator errors in sample measurement. The device features a choice of four wavelengths to allow applications ranging from reflectance to the determination of film thicknesses of a few nanometers. The laser is focused to a 1mm spot at a predetermined wavelength, in the UV, visible and near-infrared spectra, allowing for a wide range of measurements beyond the visible spectrum. To measure a sample, AUTO EL III sets up a precise alignment of incident and reflected light over a large number of angles in order to generate precise reflectance curves. This helps to accurately measure the refractive index and thickness of thin films. The measured curves are then compared to computer models that describe the light reflection according to the optical properties of the material. This comparison yields the refractive index and thickness of the material. The software also allows for repeatability tests that can be used to check the accuracy of the measurement and to optimize the reflectometer geometry for a particular sample. AUTOEL III is one of the most precise and accurate ellipsometers on the market today. It is an ideal tool for measuring thin films on a wide range of samples, from semiconductor substrates to materials for research and industrial application. Its high-performance lasers, automated rotary stage, and accurate reflectance data make it perfect for obtaining precise results in thin film measurements.