Used RUDOLPH AUTO EL III #85240 for sale

RUDOLPH AUTO EL III
Manufacturer
RUDOLPH
Model
AUTO EL III
ID: 85240
Vintage: 1984
Ellipsometer Wavelength: 633 nm Built-in printer Measuring time: 17 to 50 sec Single and double layer transparent films Displays film thickness, index, order thickness 1984 vintage.
RUDOLPH AUTO EL III ellipsometer is a device that is used to measure and analyze the optical properties of thin layers. It is used to measure the optical properties including refractive index, thickness, and layer surface topography. It uses the technique of ellipsometry, which measures the angle and polarization of reflected light from a layer of material on a substrate. RUDOLPH AUTOEL III system consists of four main components. These are the light source, polarizer/ analyzer, UHV chamber, and the optical head. The light source is a He-Ne laser that produces a beam of coherent light of a fixed wavelength and angle of incidence. The polarizer/analyzer projects and measures the polarization ellipses of the reflected light. The UHV chamber is a vacuum system that maintains the vacuum in which the ellipsometer operates. This ensures that the measurement is not distorted by the presence of ambient air. The optical head contains the mirrors that are used for collimating the incident light and the optics for properly measuring the ellipsometric angles. The operation of AUTO EL III is controlled by a user-friendly software. It allows the user to set the incident light's wavelength, polarizer angle, and analyzer angle. It also allows the user to set the surface parameters such as the refractive index, thickness and surface roughness. In addition, the software allows the user to store measurement results and to print data in the form of a strip chart. AUTOEL III offers several advantages over other instruments. It is capable of rapid measurements, enabling a high throughput in the laboratory. It is also versatile, capable of measuring a wide variety of thin layer optical properties. The software is user-friendly and quick to learn and it has excellent repeatability and accuracy of measurements. Overall, RUDOLPH AUTO EL III ellipsometer is an effective tool for measuring and analyzing the optical properties of thin layers. It is efficient, versatile and easy to use, and provides the user with highly accurate data. Its user-friendly software makes it ideal for use in the laboratory.
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